Showing results: 226 - 240 of 299 items found.
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784226-01 -
NI
PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T or 410T FPGA Reconfigurable PXI Oscilloscope—The PXIe 5172 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization. The PXIe 5172 also features a programmable Kintex-7 325T or 410T FPGA that can be used for custom acquisition, triggering, signal processing, and data streaming.
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ScanDIMM -
Corelis, Inc.
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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PHT-1840 -
Phase II Plus
This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1840 is loaded with the same features found on the base 1800 version which includes memory, USB output and software for downloading to your PC. The 1840 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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DDC Connectivity Power Controls
DDC's radiation-hardened, hybrid, Nuclear Event Detectors (NED) sense ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20ns. The active low Nuclear Event Detection signal (NED) is used to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps.
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OPS880-HM -
Axiomtek Co., Ltd.
The OPS880-HM is powered by 4th Generation Intel® Core™ i5 and i3 processors (codename: Haswell) with the Mobile Intel® HM86 Express chipset. The OPS880-HM supports one DDR3L SO-DIMM socket with memory maximum up to 8GB. In addition, it features one mSATA interface as storage device and two PCI Express Mini Card slots for graphics-enhanced video card, wireless LAN card for 802.11 b/g/n and 3G/GPRS, and tuner/AV capture card. The outstanding OPS digital signage module is an ideal choice for various display applications in different environments, e.g., shopping mall, corporate, education, bank, transportation, retail store, restaurant, performing art center.
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IDPS750 -
Salland Engineering
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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JFT -
JTAG Technologies Inc.
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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9740-T -
Strobe Data Inc.
Triple+ speed Windows/NT Osprey Co-Processor for five times the system throughput, or more. Occupies one PCI slot. A writable control store, FPGA implementation of the PDP-11 architecture with 4 MBytes of tightly coupled, zero wait-state memory. Includes FPJ11® compatible hardware floating point. Performance equivalent 3.8 times the DCJ-11® and 130% of FPJ-11. On-card x86 microprocessor rapidly processes "virtual" I/O instructions. PCI bus speeds increase disk throughput by at least a factor of ten. Qbus®/Unibus® support logic for non-emulated devices is provided on-board with connector to wide bandwidth fibrechannel Qbus or Unibus adapter. Operates only under Windows/NT. WNT Support license included.
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9740-Q -
Strobe Data Inc.
Quad+ speed Windows/NT Osprey Co-Processor for five times the system throughput, or more. Occupies one PCI slot. A writable control store, FPGA implementation of the PDP-11 architecture with 4 MBytes of tightly coupled, zero wait-state memory. Includes FPJ11® compatible hardware floating point. Performance equivalent 4.5 times the DCJ-11® and 130% of FPJ-11. On-card x86 microprocessor rapidly processes "virtual" I/O instructions. PCI bus speeds increase disk throughput by at least a factor of ten. Qbus®/Unibus® support logic for non-emulated devices is provided on-board with connector to wide bandwidth fibrechannel Qbus or Unibus adapter. Operates only under Windows/NT. WNT Support license included.
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785769-01 -
NI
PXIe, 350 MHz, 3 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5111 oscilloscope has two channels that sample up to 3 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 350 MHz of analog bandwidth. The PXIe-5111 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785767-01 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785768-11 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785768-01 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
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785767-11 -
NI
PXIe, 100 MHz, 1 GS/s, 8-Bit PXI Oscilloscope—The PXIe-5110 oscilloscope has two channels that sample up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated applications that require flexible measurement configurations and up to 100 MHz of analog bandwidth. The PXIe-5110 also features advanced PXI synchronization and data throughput capabilities. Some options also support CableSense™ technology, which can detect and locate signal path faults, changes, or discontinuities.
